A 56GS/s 8b Time-Interleaved ADC in 28nm CMOS for Direct RF Sampling Applications presents the design and performance of a high-speed, 56 gigasamples-per-second (GS/s), 8-bit time-interleaved analog-to-digital converter (ADC) built using 28nm CMOS technology. The ADC is optimized for direct RF sampling, offering a compact, power-efficient solution for applications like radar, electronic warfare, and high-bandwidth communications. Key innovations discussed include calibration techniques for channel mismatches and design strategies to achieve high linearity and low noise, highlighting significant progress in meeting the stringent demands of modern RF systems.
IEEE PAST Symposium Low-Power K/Q-Band Digital Phased Array Chiplet
Oct 11, 2022
